Rolf Von Criegern

Title: Rolf Von Criegern: Innovator in Secondary Ion Mass Spectrometry

Introduction

Rolf Von Criegern is a notable inventor based in Geretsried, Germany. He has made significant contributions to the field of secondary ion mass spectrometry, holding a total of 3 patents. His work focuses on improving the efficiency and cost-effectiveness of data storage and specimen analysis in this specialized area.

Latest Patents

Rolf's latest patents include a method and apparatus for storing measured data from sub-regions of a sputter crater. This innovative approach simplifies the data storage process, making it more cost-effective compared to traditional methods. The technique involves subdividing the region swept by the ion beam into multiple sub-areas, with each area assigned a specific memory location. This allows for the storage of signal components from individual sub-areas during the sputter crater sweep, enabling efficient data evaluation after scanning.

Another significant patent is a specimen mount designed for secondary ion mass spectrometry and other sensitive particle beam analysis methods. This mount features a rotatable support element with a carrier that holds the specimen. The dimensions of the carrier are smaller than those of the specimen, ensuring that only the specimen is in the beam path, thus enhancing the accuracy of the analysis.

Career Highlights

Rolf Von Criegern is currently associated with Siemens Aktiengesellschaft, a leading global technology company. His work at Siemens has allowed him to further develop his innovative ideas and contribute to advancements in mass spectrometry technology.

Collaborations

Rolf has collaborated with notable colleagues, including Ingo Weitzel and Peter Fazekas. These partnerships have fostered a collaborative environment that encourages innovation and the sharing of ideas.

Conclusion

Rolf Von Criegern's contributions to secondary ion mass spectrometry demonstrate his commitment to innovation and excellence in his field. His patents reflect a deep understanding of the complexities involved in data storage and specimen analysis, positioning him as a key figure in advancing this technology.