Vesilahti, Finland

Rolf Kühnis



Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 8(Granted Patents)


Company Filing History:


Years Active: 2012

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1 patent (USPTO):Explore Patents

Title: Rolf Kühnis: Innovator in Testing and Debugging Interfaces

Introduction

Rolf Kühnis is a notable inventor based in Vesilahti, Finland. He has made significant contributions to the field of integrated circuits, particularly in the area of testing and debugging interfaces. His innovative approach has led to the development of a unique patent that enhances the functionality of electronic devices.

Latest Patents

Rolf Kühnis holds a patent for "Establishing a connection between a testing and/or debugging interface and a connector." This invention relates to automatically establishing a connection between a testing and/or debugging interface to an integrated circuit and a connector of an apparatus. The connector is designed to be connectable to a testing and/or debugging apparatus, which communicates with the testing and/or debugging interface during the testing and debugging mode of the apparatus. This innovation allows for seamless transitions between testing modes and normal operation modes, improving the efficiency of electronic device management. He has 1 patent to his name.

Career Highlights

Throughout his career, Rolf Kühnis has worked with prominent companies in the technology sector. Notably, he has been associated with Nokia Corporation and Nokia Technologies Oy. His experience in these organizations has provided him with a solid foundation in the development of advanced technological solutions.

Collaborations

Rolf has collaborated with talented professionals in his field, including Zhigang Yang and Marko Winblad. These collaborations have contributed to the advancement of his projects and innovations.

Conclusion

Rolf Kühnis is a distinguished inventor whose work in establishing connections between testing interfaces and connectors has made a significant impact in the field of integrated circuits. His contributions continue to influence the development of electronic devices and their testing methodologies.

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