Company Filing History:
Years Active: 2004
Title: Rolf Hertling: Innovator in Geometric Structures and Material Parameters
Introduction
Rolf Hertling is a notable inventor based in Aachen, Germany. He has made significant contributions to the field of material science, particularly in the determination of geometric structures and material parameters on substrates. With a total of 2 patents, his work has implications for various industries, including optical media.
Latest Patents
Hertling's latest patents include a method for determining geometric structures on or in a substrate as well as material parameters. This invention provides a systematic approach to measuring reflection and/or transmission light intensity values of diffracted light according to wavelength. The process involves calculating these values using an iteration model that incorporates individual layer structures and material parameters. The parameters are modified until the measured and calculated values align as closely as possible.
Another significant patent is the method for determining the thickness of a multi-thin-layer structure. This method allows for reliable measurement results by assessing reflection and/or transmission light intensity values in relation to wavelength. The layer parameters are adjusted to achieve consistency between measured and calculated values, enabling the determination of geometrical structures within the substrate, such as the depth and width of grooves in optical media like CDs.
Career Highlights
Throughout his career, Rolf Hertling has worked with prominent companies, including Steag Hamatech AG and Steag Eta-Optik GmbH. His experience in these organizations has contributed to his expertise in the field of optical technologies and material science.
Collaborations
Hertling has collaborated with notable colleagues, including Wolfgang Schaudig and Wilbert Windeln. These partnerships have likely enriched his research and development efforts, fostering innovation in his projects.
Conclusion
Rolf Hertling's contributions to the field of material parameters and geometric structures are noteworthy. His innovative methods and patents reflect a deep understanding of optical technologies, making him a significant figure in his area of expertise.