Company Filing History:
Years Active: 1987-1988
Title: The Innovations of Roger N Langmaid
Introduction
Roger N Langmaid is a notable inventor based in New Fairfield, CT (US). He has made significant contributions to the field of integrated circuit testing, holding 2 patents that showcase his expertise and innovative thinking. His work primarily focuses on improving the efficiency and accuracy of testing very large scale integrated circuit devices.
Latest Patents
Langmaid's latest patents include a "Weighted Random Pattern Testing Apparatus and Method." This invention provides a method and apparatus for testing very large scale integrated circuit devices, particularly Level Sensitive Scan Design (LSSD) devices. The method involves applying differently configured sequences of pseudo-random patterns in parallel to each of the input terminals of the device under test. It collects the output responses from each of the output terminals in parallel, combines these outputs to obtain a signature that is a predetermined function of all the sequences of parallel outputs, and compares the test signature with a known good signature obtained by computer simulation. The input test stimuli are further altered in a predetermined fashion based on the structure of the device being tested, allowing for individual weighting of the inputs in favor of more or less binary ones or zeros.
Career Highlights
Langmaid is currently employed at International Business Machines Corporation, commonly known as IBM. His role at IBM has allowed him to work on cutting-edge technologies and contribute to advancements in integrated circuit testing methodologies.
Collaborations
Throughout his career, Langmaid has collaborated with notable colleagues such as Edward B Eichelberger and Eric Lindbloom. These collaborations have likely enriched his work and contributed to the development of innovative solutions in the field.
Conclusion
Roger N Langmaid's contributions to the field of integrated circuit testing through his patents and work at IBM highlight his role as a significant inventor. His innovative approaches continue to influence the industry and improve testing methodologies for complex electronic devices.
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