This inventor holds 1 USPTO granted patent. Top assignee: Other. Active years: 2017.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2017
Title: The Innovative Contributions of Roger Kim
Introduction
Roger Kim is an accomplished inventor based in Belmont, California. He has made significant strides in the field of microscopy through his innovative work on X-ray laser systems. His contributions have the potential to enhance the way researchers analyze materials at the microscopic level.
Latest Patents
Roger Kim holds a patent for an X-ray laser microscopy system and method. This improved system combines information obtained from both X-ray diffraction and X-ray imaging methods. The sample is placed in an ultra-cold, ultra-low pressure vacuum chamber and is exposed to brief bursts of coherent X-ray illumination. This illumination is further concentrated using X-ray mirrors and pinhole collimation methods. The system allows for higher resolution data to be obtained using hard X-ray lasers, such as free electron X-ray lasers, alongside X-ray diffraction methods. Additionally, lower resolution data can be gathered using either hard or soft X-ray laser sources and X-ray imaging methods that employ nanoscale etched zone plate technology. In some embodiments, both diffraction and imaging data can be obtained simultaneously, allowing for a more complete representation of the sample.
Career Highlights
Throughout his career, Roger Kim has focused on advancing the capabilities of X-ray microscopy. His innovative approaches have garnered attention in the scientific community, and his work continues to influence research methodologies in various fields.
Collaborations
Roger has collaborated with notable colleagues, including Michael Alan Chang and Katherine Han. These partnerships have contributed to the development and refinement of his patented technologies.
Conclusion
Roger Kim's work in X-ray laser microscopy represents a significant advancement in the field, offering new methods for obtaining detailed information about materials. His innovative contributions are paving the way for future research and applications in microscopy.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile