Los Alamos, NM, United States of America

Roger A Stutz

This inventor holds 2 USPTO granted patents. Top assignee: University of California. Active years: 1998.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Roger A Stutz. Retrieved from https://idiyas.com/inventor/roger-a-stutz

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 2

Forward Citations = 32(Granted Patents)


Company Filing History:


Years Active: 1998

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2 patents (USPTO):Explore Patents

Title: Innovations of Roger A. Stutz

Introduction

Roger A. Stutz is an accomplished inventor based in Los Alamos, NM (US). He has made significant contributions to the field of micromilling technology, holding a total of 2 patents. His work focuses on advancing data storage mediums and micromilling processes.

Latest Patents

Stutz's latest patents include "Focused ion beam micromilling and articles therefrom" and "Ultrahigh vacuum focused ion beam micromill and articles therefrom." Both patents describe an ultrahigh vacuum focused ion beam micromilling apparatus and process. Additionally, they disclose a durable data storage medium capable of storing digital or alphanumeric characters as well as graphical shapes or characters.

Career Highlights

Roger A. Stutz is affiliated with the University of California, where he continues to innovate and contribute to research in his field. His work has implications for various applications, particularly in data storage technology.

Collaborations

Stutz has collaborated with Bruce Carvell Lamartine, further enhancing the scope and impact of his inventions.

Conclusion

Roger A. Stutz's contributions to micromilling technology and data storage mediums highlight his innovative spirit and dedication to advancing scientific knowledge. His patents reflect a commitment to developing practical solutions for modern technological challenges.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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