This inventor holds 1 USPTO granted patent. Top assignee: Materials Research Corporation. Active years: 1995.
Company Filing History:
Years Active: 1995
Title: Innovations by Rodney L. Robison
Introduction
Rodney L. Robison, an accomplished inventor based in Kingston, NY, has made significant contributions to the field of thin film measurement technology. His innovative approach to ellipsometry has led to the development of a unique measuring system that enhances accuracy and efficiency in production lines for thin film samples.
Latest Patents
Rodney holds a notable patent for a "Self Aligning In-Situ Ellipsometer and Method of Using for Process." This invention features an ellipsometric measuring system that is strategically set up in association with a vacuum chamber on a production line. The system utilizes a scanner to direct the incident light beam over various locations of a thin film sample, coupled with an aperture that limits the reflected light beam received by the photodetector. This enables finer adjustments of the incident beam relative to a selected surface, ensuring precise measurements. Additionally, the system incorporates test thin film samples with known film thicknesses and indices of refraction to accurately calculate the angle of incidence of the light beam.
Career Highlights
Rodney Robison is a key member of Materials Research Corporation, where his expertise in materials science and innovation thrives. His work has positioned him as a noteworthy figure within the field, especially regarding the advancements in ellipsometric measurement techniques.
Collaborations
Throughout his career, Rodney has collaborated with talented colleagues, including Jon S. Hsu and Bhola N. De. Their collective efforts have contributed to further innovations in materials research and technology, fostering an environment of creativity and progression.
Conclusion
Rodney L. Robison's dedication to invention and improvement in materials science exemplifies the spirit of innovation. His patented technology for ellipsometry not only reflects his ingenuity but also serves as a crucial tool for efficiency in industrial applications. His work at Materials Research Corporation, alongside his esteemed collaborators, continues to pave the way for advancements in thin film measurement technology.