Riehen, Switzerland

Roderick Y H Lim

This inventor holds 1 USPTO granted patent. Top assignee: University of Basel. Active years: 2016.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Roderick Y H Lim. Retrieved from https://idiyas.com/inventor/roderick-y-h-lim

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2016

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1 patent (USPTO):Explore Patents

Title: Roderick Y H Lim: Innovator in Scanning Probe Microscopy

Introduction

Roderick Y H Lim is a notable inventor based in Riehen, Switzerland. He has made significant contributions to the field of microscopy, particularly through his innovative methods and devices.

Latest Patents

Roderick Lim holds a patent for a "Method and device for controlling a scanning probe microscope." This invention relates to a method for controlling a scanning probe microscope that includes a probe with a tip for interacting with a sample. The patent outlines a process that involves monitoring the extension of a piezo element along a specific direction and adjusting the probe's level using an additional actuator when the nanoscanner exhibits an extension beyond a threshold value.

Career Highlights

Roderick Lim is associated with the University of Basel, where he continues to advance research in the field of microscopy. His work has been instrumental in enhancing the functionality and precision of scanning probe microscopes.

Collaborations

Roderick has collaborated with notable colleagues, including Marija Plodinec and Marko Loparic, contributing to various research projects and innovations.

Conclusion

Roderick Y H Lim's contributions to scanning probe microscopy exemplify the impact of innovative thinking in scientific research. His patent reflects a commitment to advancing technology in this specialized field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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