Newbury, United Kingdom

Robin Bornoff

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Siemens Industry Software Nv. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Robin Bornoff. Retrieved from https://idiyas.com/inventor/robin-bornoff-1unz5wjl

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Robin Bornoff: Thermal Modeling and Electronic Device Innovation.

Introduction

Robin Bornoff is an inventor associated with Newbury, Great Britain, and Siemens Industry Software NV. His patent work focuses on computational methods for modeling the thermal environment of electronic devices.

Latest Patents

Bornoff is associated with 1 patent: “Methods for Modelling and Manufacturing a Device.” The patent describes a method for modeling the thermal environment of an electronic device using a volumetric mesh of the device and its surrounding medium. It determines a computational model from the mesh and thermal parameters assigned to its cells, then evaluates the model to estimate the thermal environment throughout the region. The approach embeds a boundary-condition-independent reduced-order model of at least one device component within a model of the surrounding medium.

Career Highlights

Bornoff’s listed patent reflects work at the intersection of electronic-device design, thermal analysis, and computational modeling. His association with Siemens Industry Software NV connects this work to software and engineering tools used in product development.

Collaborations

Jin Liu and Mahmood Alkhenaizi are identified as Bornoff’s coworkers. The available information does not specify their roles in the patent or whether they collaborated with him on it.

Conclusion

Robin Bornoff’s patent highlights a computational approach to analyzing heat in electronic devices by combining detailed mesh representations with reduced-order modeling.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…