Roberto Maurizio Gonella

Title: Roberto Maurizio Gonella: Semiconductor Test Structures and Anti-Fuse Technology.

Introduction

Roberto Maurizio Gonella is an inventor based in Échirolles, France. His patent work includes semiconductor test structures and anti-fuse cell technology. He is associated with 2 patents.

Latest Patents

Gonella’s listed patents address methods for testing semiconductor devices and manufacturing anti-fuse cells.

“Test Structure for Detection of Defect Devices with Lowered Resistance” describes a structure that connects multiple devices under test in parallel through test contact pads and resistors with known electrical resistance. The total resistance measured between the pads indicates how many devices have a defect-related lowered resistance. This approach enables a larger number of devices to be tested in parallel in a single measurement.

“Anti-Fuse Cell and Its Manufacturing Process” describes an anti-fuse cell built around a standard MOS transistor. Its source and drain regions are covered with metal silicide, and a resistive-layer track at least partially surrounds the transistor. A heating current causes metal from the silicide to diffuse across the source and/or drain junctions.

Career Highlights

Gonella’s patent portfolio reflects work on integrated-circuit reliability and device fabrication. The test-structure invention focuses on identifying defective devices efficiently, while the anti-fuse invention concerns a process for forming programmable circuit elements.

Collaborations

His listed company affiliations include NXP B.V. and Koninklijke Philips Corporation N.V. His named coworkers include Dirk Kenneth De Vries and Bertrand Borot.

Conclusion

Roberto Maurizio Gonella’s inventions address practical semiconductor challenges, from detecting devices with lowered resistance to manufacturing anti-fuse cells.