San Felipe, Chile

Roberto Marcelo Parada Araya

This inventor holds 1 USPTO granted patent. Top assignee: Sms Siemag Aktiengesellschaft. Active years: 2010.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Roberto Marcelo Parada Araya. Retrieved from https://idiyas.com/inventor/roberto-marcelo-parada-araya

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 7.0

ph-index = 1

Forward Citations = 5(Granted Patents)


Company Filing History:


Years Active: 2010

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1 patent (USPTO):Explore Patents

Title: The Innovative Contributions of Roberto Marcelo Parada Araya

Introduction

Roberto Marcelo Parada Araya is a notable inventor based in San Felipe, Chile. He has made significant contributions to the field of metallurgy through his innovative methods. His work focuses on improving the reduction and refining processes of metal-containing slag.

Latest Patents

Roberto holds a patent for a "Method for reducing and/or refining a metal-containing slag." This invention aims to enhance the reduction of slag by incorporating calcium carbide (CaC) as a reducing agent. This method represents a significant advancement in metallurgical processes.

Career Highlights

Roberto is currently employed at SMS Siemag Aktiengesellschaft, a company known for its expertise in metallurgical engineering. His role at the company allows him to apply his innovative ideas in practical settings, contributing to advancements in the industry.

Collaborations

Roberto has collaborated with esteemed colleagues, including Jürgen Kunze and Rolf Degel. These partnerships have fostered a creative environment that encourages the development of new technologies and methods in metallurgy.

Conclusion

Roberto Marcelo Parada Araya's contributions to the field of metallurgy through his innovative patent demonstrate his commitment to advancing industrial processes. His work continues to influence the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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