Robert W Shrank

Title: The Innovations of Robert W. Shrank

Introduction

Robert W. Shrank is a notable inventor based in Salinas, CA (US). He has made significant contributions to the field of semiconductor technology, holding a total of 2 patents. His work focuses on improving testing methods and enhancing the reliability of semiconductor devices.

Latest Patents

Among his latest patents, Shrank has developed a "Method and apparatus for source synchronous testing." This invention discloses a method where a data signal is delayed, and a selectively activated delay is applied to a clock. This innovative approach allows the clock to be positioned both before and after the data signal, improving synchronization. Another significant patent is the "Method and apparatus for burn-in of semiconductor devices." This invention involves a semiconductor device with built-in self-test circuitry that is coupled to a socket on a burn-in board. The burn-in board and the semiconductor device are heated, and burn-in instructions can be transmitted through a JTAG terminal. This allows for effective burn-in of a semiconductor device without transferring data through its input terminals.

Career Highlights

Robert W. Shrank is currently employed at Integrated Device Technology, Inc. His work at this company has been pivotal in advancing semiconductor testing technologies. His patents reflect his commitment to innovation and improving the efficiency of semiconductor devices.

Collaborations

Throughout his career, Shrank has collaborated with talented individuals such as Moussa Sobaiti and Prashant Shamarao. These collaborations have contributed to the development of cutting-edge technologies in the semiconductor industry.

Conclusion

Robert W. Shrank's contributions to semiconductor technology through his patents and collaborations highlight his role as an influential inventor. His work continues to impact the field positively, paving the way for future innovations.