Embrach, Switzerland

Robert Villiger

This inventor holds 1 USPTO granted patent. Top assignee: Mettler Instrumente Ag. Active years: 1988.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Robert Villiger. Retrieved from https://idiyas.com/inventor/robert-villiger

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 1.0

ph-index = 1

Forward Citations = 4(Granted Patents)


Company Filing History:


Years Active: 1988

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1 patent (USPTO):Explore Patents

Title: Innovations of Robert Villiger

Introduction

Robert Villiger is an accomplished inventor based in Embrach, Switzerland. He has made significant contributions to the field of temperature sensing technology. His innovative approach has led to the development of a unique temperature sensor designed for dryer accessories on weighing devices.

Latest Patents

Robert Villiger holds a patent for a temperature sensor that includes an elongated support made of a material with excellent thermal conductivity. The design features a temperature sensor element that is pressed against the support by a spring element. This configuration allows for accurate temperature measurement of the support. The substantial length of the support and its horizontal disposition relative to the heating element enable the determination of a mean temperature value.

Career Highlights

Robert Villiger is associated with Mettler Instrumente AG, a company known for its precision instruments and innovative solutions. His work at Mettler Instrumente AG has allowed him to apply his expertise in developing advanced temperature sensing technologies.

Conclusion

Robert Villiger's contributions to temperature sensing technology exemplify the spirit of innovation. His patent reflects a commitment to enhancing the functionality of weighing devices through effective temperature measurement solutions.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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