Munich, Germany

Robert Tzschoppe

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Endress+hauser Conducta Gmbh+co. Kg. Active years: 2023.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Robert Tzschoppe. Retrieved from https://idiyas.com/inventor/robert-tzschoppe-a3zn824q

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2023

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1 patent (USPTO):Explore Patents

Title: The Innovations of Robert Tzschoppe

Introduction

Robert Tzschoppe is a notable inventor based in Munich, Germany. He has made significant contributions to the field of sensor technology, particularly in the characterization and failure analysis of sensors. His innovative approach has led to the development of a unique method that enhances the understanding of sensor performance.

Latest Patents

Tzschoppe holds a patent for a method titled "Characterization and failure analysis of a sensor using impedance frequency response spectra." This patent outlines a process that involves applying an alternating current at a selected voltage to a sensor. The method includes varying the frequency of the alternating current, measuring the sensor's impedance, and analyzing the results to characterize the sensor's performance.

Career Highlights

Robert Tzschoppe is currently employed at Endress+Hauser Conducta GmbH+Co. KG, where he continues to innovate in the field of sensor technology. His work has been instrumental in advancing the understanding of sensor behavior and reliability.

Collaborations

Tzschoppe has collaborated with notable colleagues such as Jinshan Huo and Michael Hanko. These partnerships have contributed to the development of advanced sensor technologies and methodologies.

Conclusion

Robert Tzschoppe's contributions to sensor technology through his innovative patent and collaborative efforts highlight his importance in the field. His work continues to influence advancements in sensor characterization and analysis.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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