Alexandria, VA, United States of America

Robert Shaw Sneddon

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Booz Allen Hamilton Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Robert Shaw Sneddon. Retrieved from https://idiyas.com/inventor/robert-shaw-sneddon

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Robert Shaw Sneddon and Digital Image Tampering Detection.

Introduction

Robert Shaw Sneddon is an inventor associated with Alexandria, Virginia, and Booz Allen Hamilton Inc. His patent work addresses the detection of alterations to digital images using statistical analysis of image sensor data.

Latest Patents

Sneddon is associated with 1 patent: “F-stat Statistical Detection of Digital Image Tampering.” The invention describes a controller that extracts Photo Response Non-Uniformity (PRNU) data from a digital image, measures its variability within a local region and across the entire image, and compares those measurements. When the comparison falls below a threshold, the controller generates an indicator that an alteration may have occurred. This approach is designed to detect image tampering efficiently.

Career Highlights

Sneddon’s listed patent reflects work on digital image integrity and automated alteration detection. His company affiliation is Booz Allen Hamilton Inc.

Collaborations

The available information identifies Booz Allen Hamilton Inc. as Sneddon’s company affiliation but does not specify particular collaborators or co-inventors for the patent.

Conclusion

Robert Shaw Sneddon’s patent focuses on using PRNU variability to identify potential digital image alterations, contributing a statistical approach to image integrity detection.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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