Company Filing History:
Years Active: 1998-2008
Title: The Innovations of Robert Lee Ayers, Sr.
Introduction
Robert Lee Ayers, Sr. is a notable inventor based in Durham, NC (US). He has made significant contributions to the field of electronics, particularly in the area of boundary scan testing. With a total of 4 patents to his name, Ayers has demonstrated a commitment to advancing technology and improving testing methodologies.
Latest Patents
One of his latest patents is the Boundary Scan Apparatus and Interconnect Test Method. This invention involves an electronic device, such as a chip, card, or system, along with in situ boundary scan test facilities. The boundary scan test facility includes a boundary scan cell, which is a Level Sensitive Scan Design (LSSD) structure and selector. This setup connects between the output pads of the electronic device, allowing the test path for boundary scan testing to be segregated from the operational signal path used during normal device functions.
Career Highlights
Ayers has had a distinguished career, working with the International Business Machines Corporation (IBM). His role at IBM has allowed him to collaborate with other talented professionals in the field, further enhancing his contributions to technology.
Collaborations
One of his notable coworkers is Geoffrey B. Stephens. Their collaboration has likely contributed to the innovative projects and patents that Ayers has developed throughout his career.
Conclusion
Robert Lee Ayers, Sr. is a prominent figure in the field of electronics, with a focus on boundary scan testing. His inventions and patents reflect his dedication to improving technology and testing methods. His work continues to influence the industry and inspire future innovations.