The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 18, 2006
Filed:
Oct. 29, 2002
Applicant:
Robert Lee Ayers, Sr., Durham, NC (US);
Inventor:
Robert Lee Ayers, Sr., Durham, NC (US);
Assignee:
International Business Machines Corporation, Armonk, NY (US);
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
Abstract
An electronic device, such as chip, card, system and in situ boundary scan test facilities are disclosed. The boundary scan test facility includes a boundary scan cell (Level Sensitive Scan Design, LSSD structure and selector) connected between output pads of the electronic device. By so doing the test path for boundary scan testing is segregated from the operational signal path which is used when the device is performing its normal function.