Ottendorf-Okrilla, Germany

Robert Jehn

This inventor holds 3 USPTO granted patents and 1 published patent application. Top assignee: Sick Engineering Gmbh. Active years: 2017.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Robert Jehn. Retrieved from https://idiyas.com/inventor/robert-jehn

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 3 

% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 2

Forward Citations = 11(Granted Patents)


Company Filing History:


Years Active: 2017

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3 patents (USPTO):Explore Patents

Title: The Innovations of Robert Jehn

Introduction

Robert Jehn is a notable inventor based in Ottendorf-Okrilla, Germany. He has made significant contributions to the field of engineering, particularly in the development of gas meters. With a total of three patents to his name, Jehn's work reflects his commitment to innovation and technology.

Latest Patents

Jehn's latest patents include advancements in gas meter technology. These innovations aim to improve accuracy and efficiency in measuring gas consumption, which is crucial for both residential and industrial applications.

Career Highlights

Robert Jehn is currently employed at Sick Engineering GmbH, a company known for its expertise in sensor technology and automation solutions. His role at Sick Engineering has allowed him to further develop his skills and contribute to cutting-edge projects in the engineering sector.

Collaborations

Throughout his career, Jehn has collaborated with talented individuals such as Heiko Kuppi and Jens Moh. These partnerships have fostered a creative environment that encourages the exchange of ideas and the development of innovative solutions.

Conclusion

Robert Jehn's contributions to gas meter technology and his collaborations with other professionals highlight his impact on the engineering field. His dedication to innovation continues to drive advancements that benefit various industries.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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