Tracy, CA, United States of America

Robert J Tench

This inventor holds 1 USPTO granted patent. Top assignee: University of California. Active years: 1995.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Robert J Tench. Retrieved from https://idiyas.com/inventor/robert-j-tench-mo29yd9w

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 48(Granted Patents)


Company Filing History:


Years Active: 1995

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1 patent (USPTO):Explore Patents

Title: Innovations of Robert J Tench

Introduction

Robert J Tench is an accomplished inventor based in Tracy, California. He has made significant contributions to the field of instrumentation and imaging techniques. His work focuses on the development of advanced methods for imaging and manipulating small objects, including human chromosomes.

Latest Patents

Robert J Tench holds a patent for an "Imaging, cutting, and collecting instrument and method." This invention provides instrumentation and techniques to image small objects with nanometer resolution. It allows for the cutting of identified parts of such objects and the manipulation of these parts on a substrate. The technology utilizes an atomic force microscope (AFM) and modifies the conventional cantilever stylus assembly to employ multiple cantilevers with sharp tips or knife edges. Additionally, this invention can be used to measure the hardness of materials.

Career Highlights

Robert J Tench is affiliated with the University of California, where he continues to advance his research and innovations. His work has garnered attention for its potential applications in various scientific fields.

Collaborations

Robert has collaborated with notable colleagues, including Wigbert J Siekhaus and Mehdi Balooch. Their combined expertise has contributed to the success of his innovative projects.

Conclusion

Robert J Tench's contributions to imaging and instrumentation represent a significant advancement in the field. His patented technology has the potential to impact various scientific applications and enhance our understanding of small-scale objects.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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