Leo, IN, United States of America

Robert J Schramek

This inventor holds 1 USPTO granted patent. Top assignee: Lockheed Martin Corporation. Active years: 2007.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Robert J Schramek. Retrieved from https://idiyas.com/inventor/robert-j-schramek

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 48(Granted Patents)


Company Filing History:


Years Active: 2007

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1 patent (USPTO):Explore Patents

Title: Robert J. Schramek: Inventor of Dual-Mode Target-Sensing Technology.

Introduction

Robert J. Schramek is an inventor associated with Leo, Indiana, and Lockheed Martin Corporation. His recorded patent describes a dual-mode target-seeking apparatus that combines microwave and optical sensing.

Latest Patents

Schramek’s listed patent is “Dual Mode Target Sensing Apparatus.” The invention uses a seeker dome that transmits microwave energy at one frequency and light-wave energy at two other frequencies. An internal optics system transmits microwave energy while reflecting incoming light. A first detector receives the microwave energy, and a second detector uses the optical system to image a target. Schramek is credited with 1 patent in the information provided.

Career Highlights

The available information connects Schramek’s invention to Lockheed Martin Corporation. The patent’s dual-mode design brings microwave detection and optical target imaging together in one apparatus.

Collaborations

Seong-Hwoon Kim and Michael E. Weinstein are identified as Schramek’s coworkers. The provided information does not specify their roles in the patent or the invention.

Conclusion

Robert J. Schramek’s recorded patent reflects an approach to target sensing that combines microwave and optical technologies in a single apparatus.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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