Robert J Monteverde

Title: The Innovations of Robert J. Monteverde

Introduction

Robert J. Monteverde is an accomplished inventor based in Cupertino, California. He is known for his significant contributions to the field of optical scanning technology. His innovative work has led to the development of a unique patent that enhances the accuracy of wafer surface inspections.

Latest Patents

Monteverde holds a patent for a "Reference Wafer for Haze Calibration." This invention serves as a standard for calibrating wafer surface inspection optical scanners, particularly systems designed to measure haze. The reference wafer features sections divided into subsections, each containing a quasi-random pattern of light scattering features on a polished surface. This design minimizes interference patterns in scattered light, allowing for more isotropic measurements. By measuring the scattered light caused by the pits, the system can accurately calibrate to assess haze levels on non-reference wafers.

Career Highlights

Monteverde is currently employed at VLSI Standards, Inc., where he continues to push the boundaries of innovation in the semiconductor industry. His work has been instrumental in improving the precision of optical inspection systems, which are critical for maintaining quality in semiconductor manufacturing.

Collaborations

Monteverde collaborates with fellow inventor Bradley W. Scheer, contributing to advancements in their field. Their partnership exemplifies the importance of teamwork in driving technological progress.

Conclusion

Robert J. Monteverde's contributions to optical scanning technology through his innovative patent demonstrate his commitment to enhancing the accuracy of wafer inspections. His work continues to influence the semiconductor industry positively.