Binghamton, NY, United States of America

Robert J Arbogast

This inventor holds 1 USPTO granted patent and 3 published patent applications. Top assignee: Bae Systems Controls Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Robert J Arbogast. Retrieved from https://idiyas.com/inventor/robert-j-arbogast

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 8.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Robert J. Arbogast and Battery Safety Testing

Introduction

Robert J. Arbogast is an inventor associated with Binghamton, New York, and BAE Systems Controls Inc. His patent work addresses testing battery cells under conditions that can trigger thermal runaway.

Latest Patents

Arbogast is associated with 1 patent, titled “Trigger Cell for Triggering Thermal Runaway in Batteries.” The invention describes a system that applies controlled heat to a battery cell using a powered wire wrapped around the cell and separated from it by dielectric layers. The described materials include a polyimide film and mica. A temperature sensor monitors the cell or surrounding layers, while a controller adjusts the power supplied to the wire based at least in part on temperature readings. This setup is designed to support controlled testing of thermal runaway behavior in batteries.

Career Highlights

Arbogast’s listed patent reflects work on battery testing and safety, with a focus on a controllable method for inducing thermal runaway. He is associated with BAE Systems Controls Inc.

Collaborations

His listed coworkers include Jay R. Johnson and Jamie-Lynn Ganoung.

Conclusion

Robert J. Arbogast’s patent describes a temperature-monitored system for triggering thermal runaway in battery cells, contributing a practical approach to battery safety testing.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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