Foxboro, MA, United States of America

Robert F Smith


Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 4(Granted Patents)


Company Filing History:


Years Active: 2010

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1 patent (USPTO):Explore Patents

Title: The Innovations of Robert F. Smith

Introduction

Robert F. Smith is an accomplished inventor based in Foxboro, MA (US). He has made significant contributions to the field of semiconductor design, particularly in high-speed SERDES cores. His innovative approach has led to the development of a unique patent that enhances testing methods for these complex systems.

Latest Patents

One of Robert F. Smith's notable patents is titled "Selective test point for high speed SERDES cores in semiconductor design." This invention focuses on a method and system for testing systems that involve high-speed SERDES cores by exposing the internal nature of signals. The signals are tapped at various external test points, allowing for more effective testing. The invention may utilize one or more test points in the receive and/or transmit paths of high-speed SERDES cores, routing signals to the pins or balls on a chip. Programmable directing, or multiplexing, of signals is employed to limit the number of output debug ports, thereby controlling the pin count required for the chip. This innovation represents a significant advancement in semiconductor testing.

Career Highlights

Robert F. Smith is currently associated with LSI Corporation, where he continues to apply his expertise in semiconductor technology. His work has been instrumental in developing solutions that improve the efficiency and effectiveness of semiconductor designs.

Collaborations

Throughout his career, Robert has collaborated with talented individuals such as Danny C. Vogel and Bryan Robb. These partnerships have fostered an environment of innovation and creativity, leading to advancements in their respective fields.

Conclusion

Robert F. Smith's contributions to semiconductor design and testing methodologies exemplify the spirit of innovation. His patent on selective test points for high-speed SERDES cores showcases his commitment to enhancing technology in this critical area. His work continues to influence the industry and inspire future advancements.

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