The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 21, 2010
Filed:
May. 24, 2005
Applicants:
Danny Vogel, Sudbury, MA (US);
Bryan Robb, Norwood, MA (US);
Robert F Smith, Foxboro, MA (US);
Inventors:
Assignee:
LSI Corporation, Milpitas, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/08 (2006.01);
U.S. Cl.
CPC ...
Abstract
The present invention is directed to a method and system for testing systems involving high speed SERDES cores by exposing an internal nature of signals. The signals are tapped at various external test points. The present invention may take one or more test points in receive and/or transmit paths of high speed SERDES cores, and expose the test points by routing signals to the pins/balls on a chip. Programmable directing (multiplexing) of signals may be utilized to restrict number of output debug ports. Consequently, the number of the pin count required for the chip may be controlled.