Robert F Kunesh

This inventor holds 4 USPTO granted patents. Top assignee: Texas Instruments Corporation. Active years: 1996-2005.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Robert F Kunesh. Retrieved from https://idiyas.com/inventor/robert-f-kunesh

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 4

% Patents Active = 100.0

Average Co-Inventor Count = 2.2

ph-index = 4

Forward Citations = 93(Granted Patents)

Company Filing History:

4 out of 29,901

Texas Instruments Corporation

patents

Years Active: 1996-2005

Loading Chart...

4 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 6979647 - Method for chemical etch control of noble metals in the presence of less noble metals (2005-12-27),

2. 5698040 - Method for rotational wafer cleaning in solution (1997-12-16),

3. 5698038 - Method for wafer carrier cleaning (1997-12-16),

4. 5520205 - Apparatus for wafer cleaning with rotation (1996-05-28),

Title: The Inventive Journey of Robert F Kunesh

Introduction: Robert F Kunesh is a prolific inventor based in Plano, Texas, known for his groundbreaking contributions to various industries.

Latest Patents: Robert F Kunesh holds several patents in the fields of technology, healthcare, and consumer products, showcasing his diverse range of innovative ideas.

Career Highlights: With a career spanning over two decades, Robert F Kunesh has worked with leading companies to bring his inventions to life, revolutionizing the way we interact with everyday products.

Collaborations: Throughout his career, Robert F Kunesh has collaborated with top researchers, engineers, and designers to push the boundaries of innovation and create solutions that make a difference in people's lives.

Conclusion: Robert F Kunesh's passion for innovation and his relentless pursuit of excellence continue to inspire the next generation of inventors to think outside the box and create a better future for all.

Profile summary based on public USPTO records.

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]