Company Filing History:
Years Active: 1988-1990
Title: **Innovator Spotlight: Robert E. Keil**
Introduction:
Robert E. Keil is a distinguished inventor based in St. Louis Park, Minnesota. With a focus on advanced optical measurement technologies, he holds two patents that showcase his significant contributions to the field.
Latest Patents:
Keil's latest patents include innovative designs for point and line range sensors. These high-precision, non-contact sensors optically measure distances from the sensor head to various surfaces under test. The modular design of the system permits a wide array of identically packaged sensor heads with diverse ranges and resolutions. Built-in algorithms dynamically adjust exposure time and process data to ensure maximum accuracy across numerous applications. The sensor heads utilize a laser diode source that emits both visible and infrared radiation to facilitate setup and usage. A unique optical system is employed to focus the laser beam onto a detector array, where data is processed to calculate distances for point range sensors and surface profiles for line range sensors. High-speed algorithms help distill data from the imaging array to produce meaningful range data. Furthermore, the software can adjust exposure and laser power to maintain a dynamic range of 10^7, accommodating various surface types. Operators can conveniently reject specific areas of the optical image to eliminate erroneous readings resulting from multiple reflections and can select from up to sixteen different heads for multiple measurements through a user-friendly interface linked to a computer system.
Another notable patent of Keil's describes a laser probe for determining distance. This laser-based, optically triggered sensor system serves as a coordinate measuring machine (CMM) probe. Utilizing this sensor, a CMM can pinpoint the exact location of a test object's surface without physical contact. The reflectivity of the laser beam is captured by a detector pair, whose light ratio indicates the probe's measurement range, signaling whether the test object is too far, too close, or appropriately positioned for measurement. This system serves as a plug-compatible replacement for traditional contact trigger probes used in most CMMs.
Career Highlights:
Keil’s career is marked by his invaluable work at Cyberoptics Corporation, where he has made significant advancements in optical sensing technologies. His innovative patents have contributed to the field, enhancing accuracy and efficiency in measurement applications.
Collaborations:
Throughout his career, Robert has collaborated with esteemed colleagues, including Steven K. Case and John P. Konicek. These collaborations have played a pivotal role in developing groundbreaking technologies within the optical measurement domain.
Conclusion:
Robert E. Keil's innovative spirit and dedication to advancing optical measurement technologies have made a notable impact in the field. His patents reflect a commitment to enhancing precision and functionality in measurement systems, ensuring his position as a leading inventor in the industry.