The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 02, 1990

Filed:

Apr. 15, 1987
Applicant:
Inventors:

Steven K Case, St. Louis Park, MN (US);

Robert E Keil, St. Louis Park, MN (US);

Jeffrey A Jalkio, St. Paul, MN (US);

Assignee:

CyberOptics Corporation, Minneapolis, MN (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01C / ; G06F / ;
U.S. Cl.
CPC ...
364562 ; 364561 ; 33707 ; 250201 ; 356-4 ; 356375 ;
Abstract

High precision, non-contact sensors are disclosed which optically measure distances from the sensor head to the surface or surfaces under test. The modular design of the system allows a large selection of identically packaged sensor heads with differing ranges and resolutions. Built-in algorithms automatically adjust exposure time and process data to maximize accuracy for most applications. The sensor heads contain a laser diode source which features visible radiation as well as infrared radiation to faciltiate set-up and use of the system. A unique optical system focuses the laser beam on a detector array. That data is processed to determine distance for point range sensors and surface profile for line range sensors. High speed algorithms are employed for reducing the data from the imaging array in the sensor head to meaningful range data. To compensate for widely varying surfaces of the software can vary the exposure and laser power to yield a dynamic range of 10.sup.7. The user can reject certain areas of the optical image and, therefore, eliminate erroneous readings that could be caused by multiple reflections from complex geometries. The operator can also select up to sixteen different heads, one at a time, for multiple measurements. Operator interface is conveniently provided through the keyboard to an attached computer system.


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