Robert E Garner

Title: The Innovations of Robert E Garner

Introduction

Robert E Garner is a notable inventor based in Miyagi-ken, Japan. He is recognized for his contributions to the field of integrated circuits, particularly in the development of methods and apparatuses that enhance testing functionalities. His work has significantly impacted the efficiency and reliability of integrated circuit testing.

Latest Patents

Robert E Garner holds a patent for an "Apparatus and method for generating integrated circuit test patterns." This invention involves a comprehensive method for generating integrated circuit test patterns to assess the functionality of integrated circuits. The process includes generating and retaining module test stimuli for each module within an integrated circuit. These stimuli are then translated into module drive patterns, which are used to determine expected patterns based on module models. The integrated circuit data is utilized to translate these patterns into test patterns, which are validated and transformed into test vectors. Ultimately, these vectors are applied to the external connections of the integrated circuit to ensure its functionality.

Career Highlights

Garner has had a distinguished career, working with Motorola Corporation, a leading company in the telecommunications and electronics industry. His innovative approach to integrated circuit testing has positioned him as a key figure in the field. Garner's patent reflects his commitment to advancing technology and improving testing methodologies.

Collaborations

Throughout his career, Robert E Garner has collaborated with notable colleagues, including Connie Astrachan and Edward J Hathaway. These partnerships have contributed to the development of innovative solutions in integrated circuit technology.

Conclusion

Robert E Garner's contributions to the field of integrated circuits through his patent and work at Motorola Corporation highlight his significant role as an inventor. His innovative methods for generating integrated circuit test patterns continue to influence the industry and improve testing processes.