Tel Aviv, Israel

Robert Barron

This inventor holds 1 USPTO granted patent and 1 published patent application. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Robert Barron. Retrieved from https://idiyas.com/inventor/robert-barron-sfg3jf3y

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Robert Barron and Event-Based IT Log Diagnosis.

Introduction

Robert Barron is an inventor associated with Tel Aviv, Israel. His patent work addresses the challenge of diagnosing application incidents by analyzing patterns in IT logs and identifying periods that may contain relevant events.

Latest Patents

Barron is associated with 1 patent, titled “Efficient Diagnosis of Logs Based on Events.” The invention describes a method, system, and computer program product for diagnosing IT logs after an application incident is reported. It gathers data about application-related events over a defined time range, creates a time series for each event type, and calculates event-change scores across time windows. It then combines those scores into an overall score for each window and identifies windows of interest when their scores exceed a threshold.

Career Highlights

The patent highlights an approach to narrowing the search for useful diagnostic information in large volumes of IT log data. By scoring event changes over time, the system can help identify periods that warrant closer investigation.

Collaborations

Seema Nagar is identified as Barron’s coworker. The available information does not specify her role in the patent or the nature of their collaboration.

Conclusion

Robert Barron’s patent focuses on using event patterns and time-based scoring to identify promising regions in IT logs, offering a structured approach to application incident diagnosis.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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