Carriere, MS, United States of America

Robert A Arnone

USPTO Granted Patents = 2 

Average Co-Inventor Count = 2.9

ph-index = 2

Forward Citations = 9(Granted Patents)


Company Filing History:


Years Active: 1987-2013

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2 patents (USPTO):Explore Patents

Title: Innovations of Robert A. Arnone

Introduction

Robert A. Arnone is a notable inventor based in Carriere, Mississippi, who has made significant contributions to the field of optical detection and satellite imagery. With a total of two patents to his name, Arnone's work focuses on enhancing the accuracy of environmental monitoring through advanced technological methods.

Latest Patents

Arnone's latest patents include an "Automated system and method for optical cloud shadow detection over water." This invention provides a system and method for detecting cloud shadows over water using ocean color imagery received from remote sensors. Another significant patent is the "Method for determining an Angstrom exponent for correcting satellite." This method effectively removes atmospheric contamination from a sequence of satellite color scanner ocean imagery by determining an optimum Angstrom exponent for weighting data across various channels of different wavelengths.

Career Highlights

Robert A. Arnone is currently associated with the United States Navy, where he contributes his expertise in optical detection and satellite imagery. His work has been instrumental in improving the accuracy of environmental data collection, which is crucial for various applications, including climate monitoring and resource management.

Collaborations

Arnone has collaborated with notable colleagues such as Ronald J. Holyer and Ruhul Amin, enhancing the impact of his inventions through teamwork and shared expertise.

Conclusion

Robert A. Arnone's innovative contributions to optical detection and satellite imagery exemplify the importance of technological advancements in environmental monitoring. His patents reflect a commitment to improving data accuracy and reliability in this critical field.

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