Umea, Sweden

Rickard Sjoegren

This inventor holds 2 USPTO granted patents. Top assignee: Sartorius Stedim Data Analytics Ab. Active years: 2024-2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Rickard Sjoegren. Retrieved from https://idiyas.com/inventor/rickard-sjoegren

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 50.0

Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:


Years Active: 2024-2026

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2 patents (USPTO):Explore Patents

Title: Rickard Sjoegren: Innovator in Data Analysis Technology

Introduction

Rickard Sjoegren is a notable inventor based in Umea, Sweden. He has made significant contributions to the field of data analysis through his innovative patent. His work focuses on utilizing deep neural networks for processing images and analyzing data effectively.

Latest Patents

Rickard holds a patent for a "Computer-implemented method, computer program product and system for data analysis." This invention provides a comprehensive method for data analysis using a deep neural network. The method involves processing images and training datasets to identify outliers in data observations. The deep neural network consists of multiple hidden layers, which enhance its ability to analyze complex data sets.

Career Highlights

Rickard Sjoegren is currently employed at Sartorius Stedim Data Analytics AB, where he applies his expertise in data analysis and machine learning. His innovative approach has positioned him as a key figure in the development of advanced analytical tools.

Collaborations

Rickard collaborates with his coworker, Johan Trygg, to further enhance the capabilities of their data analysis systems. Their teamwork fosters an environment of innovation and creativity, leading to groundbreaking advancements in their field.

Conclusion

Rickard Sjoegren's contributions to data analysis through his patented technology exemplify the impact of innovation in the field. His work continues to influence the way data is processed and analyzed, paving the way for future advancements.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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