Tokyo, Japan

Rick Salay

This inventor holds 1 USPTO granted patent. Top assignee: Inter-University Research Institute Corporation Research Organization of Information and Systems. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Rick Salay. Retrieved from https://idiyas.com/inventor/rick-salay

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 6.0

ph-index = 1


Company Filing History:


Years Active: 2026

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Rick Salay: Inventor in Information Processing and Control Design

Introduction

Rick Salay is an inventor associated with Tokyo, Japan, and the Inter-University Research Institute Corporation Research Organization of Information and Systems. His patent work concerns information processing and assistance with control-system design.

Latest Patents

The provided information lists one patent for Rick Salay: “Information processing device, control design assistance method, and recording medium.” The invention describes a device that acquires a first controller model, which specifies a measurement-based control condition and the action taken when that condition is met. It then outputs a second controller model designed to tolerate measurement values that include errors, deriving its control condition and action from the information in the first model. Salay is credited with 1 patent.

Career Highlights

Salay’s listed patent reflects work on adapting controller models to account for measurement error. His stated organizational affiliation is the Inter-University Research Institute Corporation Research Organization of Information and Systems.

Collaborations

The provided information names Tsutomu Kobayashi and Ichiro Hasuo as Salay’s coworkers. It does not specify their roles in the patent.

Conclusion

Rick Salay’s listed invention focuses on making control-design models more tolerant of measurement error, highlighting his contribution to information processing and controller design.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…