Sunnyvale, CA, United States of America

Rick Francis


Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2011-2013

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2 patents (USPTO):

Title: The Innovations of Rick Francis

Introduction

Rick Francis is an accomplished inventor based in Sunnyvale, California. He has made significant contributions to the field of semiconductor technology, holding a total of 2 patents. His work focuses on methods for determining dielectric breakdown voltage, which is crucial for the reliability of semiconductor devices.

Latest Patents

Rick's latest patents include a method and system for non-destructive determination of dielectric breakdown voltage in a semiconductor wafer. This innovative method involves injecting a test current in increasing ramp steps into the dielectric layer and measuring the test voltage across the layer. The process allows for the detection of a dropped test voltage, which indicates the breakdown voltage of the dielectric layer. Another notable patent is related to dielectric breakdown lifetime enhancement using alternating current capacitance. This patent describes a technique for determining the time-to-breakdown for a dielectric layer based on sudden changes in capacitance when an alternating voltage is applied.

Career Highlights

Throughout his career, Rick has worked with prominent companies in the semiconductor industry, including Advanced Micro Devices Corporation and GlobalFoundries Inc. His experience in these organizations has allowed him to develop and refine his innovative ideas, contributing to advancements in semiconductor technology.

Collaborations

Rick has collaborated with talented individuals such as Kok Yong Yiang and Amit P Marathe, further enhancing his work in the field.

Conclusion

Rick Francis is a notable inventor whose contributions to semiconductor technology have led to significant advancements in the industry. His innovative patents and collaborations reflect his dedication to improving the reliability and performance of semiconductor devices.

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