Clarence, NY, United States of America

Richard W Lally

This inventor holds 1 USPTO granted patent. Top assignee: Pcb Piezotronics, Inc.. Active years: 1989.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Richard W Lally. Retrieved from https://idiyas.com/inventor/richard-w-lally-tlpdlr3h

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 1.0

ph-index = 1

Forward Citations = 17(Granted Patents)


Company Filing History:


Years Active: 1989

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1 patent (USPTO):Explore Patents

Title: The Innovative Contributions of Richard W. Lally

Introduction

Richard W. Lally is a notable inventor based in Clarence, NY (US). He has made significant contributions to the field of instrumentation through his innovative designs. His work primarily focuses on creating tools that enhance testing and measurement accuracy.

Latest Patents

Richard W. Lally holds a patent for an instrumented test hammer. This device is designed to vibrationally excite a test object, featuring a head assembly with an impact tip and a transducer. The transducer is arranged to sense the force of an impact and convert it into a proportional electrical signal. The hammer is uniquely tuned by selecting appropriate grip materials and balancing the mass of the head assembly with the handle and grip. This design minimizes spurious electrical signals caused by post-impact vibrations.

Career Highlights

Richard W. Lally is associated with PCB Piezotronics, Inc., where he applies his expertise in developing advanced testing instruments. His career reflects a commitment to innovation and precision in measurement technology.

Collaborations

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Conclusion

Richard W. Lally's contributions to the field of instrumentation, particularly through his patented test hammer, demonstrate his dedication to enhancing measurement accuracy. His work continues to influence the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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