Nuremberg, Germany

Richard Oechsner

This inventor holds 1 USPTO granted patent. Top assignee: Other. Active years: 2003.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Richard Oechsner. Retrieved from https://idiyas.com/inventor/richard-oechsner

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 6.0

ph-index = 1

Forward Citations = 11(Granted Patents)


Company Filing History:

goldMedal1 out of 834,659 
Other
 patents

Years Active: 2003

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1 patent (USPTO):Explore Patents

Title: Richard Oechsner and Production-Process Quality Surveillance

Introduction

Richard Oechsner is an inventor associated with Nuremberg, Germany. His patent work addresses quality monitoring in manufacturing processes that produce multiple product types in parallel or near-parallel.

Latest Patents

Oechsner is credited with 1 patent: “Quality Surveillance of a Production Process.” The method monitors technical product parameters at manufacturing stations and uses random samples to calculate average values for different product types. These values are organized in a multidimensional average, allowing quality measurements across product types to be recorded and compared.

Career Highlights

The patent describes a structured approach to tracking quality in production lines with sequential manufacturing stations. It combines station-level measurements, product-type sampling, and calculated averages to support surveillance of processes involving varied products.

Collaborations

The supplied information lists Poitr Strzyzewski and Claus Schneider as Oechsner’s coworkers.

Conclusion

Richard Oechsner’s documented invention focuses on organizing quality measurements across diverse products in a manufacturing process, with the aim of making production surveillance systematic and comparable.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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