Tokyo, Japan

Richard Norio Blythe


Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:

goldMedal1 out of 832,812 
Other
 patents

Years Active: 2022

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1 patent (USPTO):Explore Patents

Title: Richard Norio Blythe: Innovator in Ultra-High Resolution Panel Inspection

Introduction

Richard Norio Blythe is a notable inventor based in Tokyo, Japan. He has made significant contributions to the field of electrical circuit inspection, particularly through his innovative patent. His work focuses on enhancing the detection of defects in ultra-high resolution panels, which is crucial for various technological applications.

Latest Patents

Richard Norio Blythe holds a patent for a "Method for detecting defects in ultra-high resolution panels." This system is designed for the inspection of electrical circuits that consist of multiple conductors spaced apart from each other. The system includes a voltage driver that applies different electrical voltages to a selected group of conductors. A sensor is employed to detect characteristics of a test region within the electrical circuits, although it lacks the spatial resolution to differentiate between individual conductors. A defect indicator then assesses the sensor's output to determine the presence of any defects in the conductors. This innovative approach enhances the reliability and efficiency of circuit inspections.

Career Highlights

Throughout his career, Richard has demonstrated a commitment to advancing technology in the field of electrical engineering. His patent reflects his expertise and innovative thinking, which have positioned him as a valuable contributor to the industry.

Collaborations

Richard collaborates with Raul Albert Martin, working together to push the boundaries of technology and improve inspection methods in their field.

Conclusion

Richard Norio Blythe's contributions to the field of electrical circuit inspection through his innovative patent highlight his role as a significant inventor. His work not only enhances the detection of defects but also sets a foundation for future advancements in technology.

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