Herts, United Kingdom

Richard Neil Hunt

This inventor holds 1 USPTO granted patent. Top assignees: Mstar Semiconductor, Inc., Mstar France Sas, Mstar Software R&d, Ltd.. Active years: 2012.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Richard Neil Hunt. Retrieved from https://idiyas.com/inventor/richard-neil-hunt

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2012

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1 patent (USPTO):Explore Patents

Title: Richard Neil Hunt: Innovator in Baud Rate Detection

Introduction

Richard Neil Hunt is a notable inventor based in Herts, Great Britain. He has made significant contributions to the field of data communication, particularly through his innovative patent related to baud rate detection. His work has implications for how data streams are characterized and processed.

Latest Patents

Richard Neil Hunt holds a patent for a method of characterizing a data stream of binary symbols. This method involves sampling the stream at a predetermined rate that captures at least two samples per binary symbol. It identifies the shortest continuous run of samples with the same logic level and assigns a symbol rate based on the identified run being one symbol in length. This innovation enhances the efficiency and accuracy of data transmission.

Career Highlights

Throughout his career, Richard has worked with several companies, including Mstar Semiconductor, Inc. and Mstar Software R&D, Ltd. His experience in these organizations has allowed him to develop and refine his expertise in data communication technologies.

Collaborations

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Conclusion

Richard Neil Hunt's contributions to baud rate detection exemplify the importance of innovation in data communication. His work continues to influence the field and showcases the impact of dedicated inventors in technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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