Middlesex, United Kingdom

Richard Lynn Hedgeley

This inventor holds 1 USPTO granted patent. Top assignee: Central Research Laboratories Limited. Active years: 2003.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Richard Lynn Hedgeley. Retrieved from https://idiyas.com/inventor/richard-lynn-hedgeley

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 6.0

ph-index = 1

Forward Citations = 8(Granted Patents)


Company Filing History:


Years Active: 2003

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1 patent (USPTO):Explore Patents

Title: Richard Lynn Hedgeley: Innovator in Analytical Sampling Devices

Introduction

Richard Lynn Hedgeley is a notable inventor based in Middlesex, GB. He has made significant contributions to the field of analytical sampling devices. His innovative work has led to the development of a patented device that enhances the efficiency and accuracy of sampling processes.

Latest Patents

Richard holds a patent for an analytical sampling device. This invention showcases his expertise and commitment to advancing technology in analytical methods. The patent reflects his ability to address practical challenges in the field.

Career Highlights

Richard is associated with Central Research Laboratories Limited, where he applies his skills and knowledge to further research and development. His role at the company has allowed him to contribute to various projects that aim to improve analytical techniques.

Collaborations

Richard has worked alongside talented individuals such as Malcolm Trayton Austen and John Robert Dodgson. These collaborations have fostered a creative environment that encourages innovation and the sharing of ideas.

Conclusion

Richard Lynn Hedgeley is a distinguished inventor whose work in analytical sampling devices has made a lasting impact. His contributions continue to influence the field, and his collaborations with other professionals highlight the importance of teamwork in innovation.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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