Knoxville, TN, United States of America

Richard L Wyman

This inventor holds 1 USPTO granted patent. Top assignee: Heimann Systems Gmbh. Active years: 2005.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Richard L Wyman. Retrieved from https://idiyas.com/inventor/richard-l-wyman

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 22(Granted Patents)


Company Filing History:


Years Active: 2005

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1 patent (USPTO):Explore Patents

Title: Richard L. Wyman: Innovator in Non-Destructive Inspection Technology

Introduction

Richard L. Wyman is a notable inventor based in Knoxville, TN (US). He has made significant contributions to the field of non-destructive inspection technology. His innovative approach has led to the development of a unique patent that enhances the inspection process of materials housed in containers.

Latest Patents

Wyman holds a patent for an "Apparatus and method for non-destructive inspection of material in containers." This invention involves orienting an X-ray beam emitter and detector to direct and detect an X-ray beam at an angle ranging from 8° to 20° to the conveying direction of a conveyor. The optimal beam angle is approximately 10°, which effectively de-emphasizes the leading and trailing edges of the containers. This method allows for easier analysis of the detector images, making a one-detector system sufficient in many cases.

Career Highlights

Richard L. Wyman is associated with Heimann Systems GmbH, where he applies his expertise in non-destructive inspection technologies. His work has been instrumental in advancing the capabilities of inspection systems used in various industries.

Collaborations

Wyman collaborates with talented professionals such as Todd Schrock and Adam Williamson. Their combined efforts contribute to the innovative projects at Heimann Systems GmbH.

Conclusion

Richard L. Wyman's contributions to non-destructive inspection technology exemplify the impact of innovation in enhancing material inspection processes. His patent reflects a significant advancement in the field, showcasing his dedication to improving industry standards.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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