Canton, OH, United States of America

Richard Joseph Olsen

This inventor holds 1 USPTO granted patent. Top assignee: Other. Active years: 2002.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Richard Joseph Olsen. Retrieved from https://idiyas.com/inventor/richard-joseph-olsen

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:

goldMedal1 out of 834,513 
Other
 patents

Years Active: 2002

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1 patent (USPTO):Explore Patents

Title: Richard Joseph Olsen: Innovator in Estimation and Ratioing Methods

Introduction

Richard Joseph Olsen is an accomplished inventor based in Canton, OH (US). He has made significant contributions to the field of estimation and ratioing methods, showcasing his expertise through his innovative patent.

Latest Patents

Richard holds a patent for a "Method for handling estimation/ratioing of adjustment." This method allows for the estimation of selected parameters of a given population based on non-homogenous sampling of the population data. The approach utilizes an algorithm applied to data in a 'least parts' manner, facilitating the assumption that the sampling of data is 'piece-wise' homogenous, despite the overall non-homogeneity of the data sampling.

Career Highlights

Throughout his career, Richard has demonstrated a commitment to advancing methodologies in data estimation. His work has implications for various fields that rely on accurate data analysis and interpretation.

Collaborations

Richard has collaborated with notable colleagues, including David Henry Manka and Ray Allison Young, contributing to a dynamic work environment that fosters innovation.

Conclusion

Richard Joseph Olsen's contributions to the field of estimation and ratioing methods highlight his innovative spirit and dedication to advancing technology. His patent reflects a significant step forward in handling complex data sampling challenges.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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