Richard J Nay

Title: Innovations of Richard J Nay in Interfacial Adhesion Measurement

Introduction

Richard J Nay is an accomplished inventor based in Shorewood, MN (US). He has made significant contributions to the field of interfacial adhesion measurement, holding a total of 4 patents. His work focuses on developing methods that enhance the understanding of adhesion properties in various materials.

Latest Patents

Richard J Nay's latest patents include innovative methods for measuring the properties of interfacial adhesion. One notable patent describes a method for measuring toughness of interfacial adhesion by applying a normal force with a probe to a surface of a coating joined to a major surface of a substrate. This method involves applying a lateral force to the coating, creating delaminated regions as the probe moves laterally across the surface. The toughness of interfacial adhesion is determined based on changes in the magnitude of the lateral force over time. Another patent focuses on measuring interfacial adhesion properties specifically in electronic structures, utilizing a similar approach to assess the toughness of adhesion between coatings and substrates.

Career Highlights

Richard J Nay is currently associated with Hysitron Incorporated, where he continues to innovate in the field of materials science. His expertise in interfacial adhesion has positioned him as a key figure in advancing measurement techniques that are critical for various applications.

Collaborations

Throughout his career, Richard has collaborated with notable colleagues, including Dehua Yang and David J Vodnick. These collaborations have further enriched his research and development efforts in the field.

Conclusion

Richard J Nay's contributions to the measurement of interfacial adhesion properties are invaluable. His innovative methods and patents reflect his dedication to advancing technology in materials science. His work continues to influence the industry and pave the way for future innovations.