Richard Graetz

Title: The Innovations of Richard Graetz

Introduction

Richard Graetz is an accomplished inventor based in Mountain View, CA (US). He has made significant contributions to the field of metrology, particularly in the semiconductor industry. His innovative work has led to the development of a unique patent that enhances the measurement capabilities of wafers.

Latest Patents

Richard Graetz holds a patent for an "All Surface Film Metrology System." This system is designed to perform metrology on various surfaces of a wafer, including the front surface, back surface, and edges. The technology allows for comprehensive wafer metrology and the ability to measure thin films on the back surface of the wafer. By utilizing a ratio of a greyscale image of bright field light emerging from the back surface of the wafer under test to that of a reference wafer, the system can determine the thickness and optical properties of thin films effectively.

Career Highlights

Richard Graetz is associated with Kla Tencor Corporation, a leading company in the field of semiconductor equipment. His work at Kla Tencor has positioned him as a key player in advancing metrology technologies. His innovative contributions have been instrumental in improving the accuracy and efficiency of wafer measurements.

Collaborations

Richard has collaborated with notable colleagues, including Shifang Li and Lena Nicolaides. Their combined expertise has fostered a collaborative environment that encourages innovation and the development of cutting-edge technologies.

Conclusion

Richard Graetz's contributions to the field of metrology through his patent and work at Kla Tencor Corporation highlight his role as a significant inventor in the semiconductor industry. His innovative spirit continues to drive advancements in wafer measurement technologies.