Endwell, NY, United States of America

Richard Edward Shipway

This inventor holds 1 USPTO granted patent. Top assignee: International Business Machines Corporation. Active years: 1977.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Richard Edward Shipway. Retrieved from https://idiyas.com/inventor/richard-edward-shipway

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 54(Granted Patents)


Company Filing History:


Years Active: 1977

Loading Chart...
1 patent (USPTO):Explore Patents

Title: The Innovations of Richard Edward Shipway

Introduction

Richard Edward Shipway is a notable inventor based in Endwell, NY (US). He has made significant contributions to the field of defect inspection, particularly in electronic circuits. His innovative approach has led to the development of a unique patent that enhances the quality assessment of various objects.

Latest Patents

Richard holds a patent for a method of defect inspection of objects such as electronic circuits. This patent involves comparing successive areas of a high-resolution object image with corresponding areas of a low-resolution master pattern. The process produces signals that represent the quality of the object. The comparison is achieved by detecting which features occur in each area of the object image and determining whether these features match those in a larger area of the master pattern.

Career Highlights

Richard Edward Shipway is associated with the International Business Machines Corporation, commonly known as IBM. His work at IBM has allowed him to focus on advancing technologies related to defect inspection and quality assurance in electronic components.

Collaborations

One of Richard's notable coworkers is Duane W Baxter. Their collaboration has contributed to the development of innovative solutions in their field.

Conclusion

Richard Edward Shipway's contributions to defect inspection technology exemplify the impact of innovation in the electronics industry. His patent and work at IBM highlight the importance of quality assurance in modern technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…