Bry-sur-Marne, France

Richard Day

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Trimble Jena Gmbh. Active years: 2021.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Richard Day. Retrieved from https://idiyas.com/inventor/richard-day-6591hl2b

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

 

Average Co-Inventor Count = 6.0

ph-index = 1


Company Filing History:


Years Active: 2021

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1 patent (USPTO):Explore Patents

Title: Richard Day - Innovator in Surveying Technology

Introduction

Richard Day is a notable inventor based in Bry-sur-Marne, France. He has made significant contributions to the field of surveying technology, particularly with his innovative patent that enhances the efficiency and accuracy of surveying systems.

Latest Patents

Richard Day holds a patent for a "Surveying system and rotating mirror for a surveying system." This invention comprises a support structure, a rotating mirror unit with a motor and a mirror mounted on a shaft, and a measuring unit that includes a light source and optics. The design allows for precise measurement by directing a beam of light onto the mirror surface, facilitating accurate surveying.

Career Highlights

Throughout his career, Richard has worked with prominent companies in the industry, including Trimble Jena GmbH and Trimble Inc. His experience in these organizations has allowed him to refine his skills and contribute to advancements in surveying technology.

Collaborations

Richard has collaborated with talented individuals such as Wolfram Prudlow and Michael Kötzing. These partnerships have fostered innovation and have been instrumental in the development of his patented technology.

Conclusion

Richard Day's contributions to surveying technology through his innovative patent and collaborations with industry professionals highlight his role as a significant inventor in this field. His work continues to influence the way surveying is conducted today.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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