This inventor holds 1 USPTO granted patent. Top assignee: Lockheed Missiles & Space Company, Inc.. Active years: 1992.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 1992
Title: Richard C Barry - Innovator in Stereoscopic Radiographic Inspection
Introduction
Richard C Barry is a notable inventor based in Palo Alto, California. He has made significant contributions to the field of radiographic inspection technology. His innovative approach has led to the development of a unique system that enhances the visualization of test objects through stereoscopic imaging.
Latest Patents
Richard C Barry holds a patent for a "Stereoscopic Radiographic Inspection System." This invention involves irradiating an object in a sequence of different positions with respect to an X-ray beam emitted by a single source. A single X-ray detector produces a series of electronic signals corresponding to the various positions of the test object. These signals are then converted into a pair of series of signals, with one series delayed relative to the other. The resulting pair of signals is displayed as a stereoscopic pair of visual images, allowing observers to perceive a series of stereoscopic X-ray images of the test object.
Career Highlights
Richard C Barry is associated with Lockheed Missiles & Space Company, Inc., where he has applied his expertise in developing advanced inspection systems. His work has contributed to the enhancement of safety and efficiency in various applications.
Collaborations
Throughout his career, Richard has collaborated with notable colleagues, including Lee M Klynn and Robert A Buchanan. These partnerships have fostered innovation and the sharing of ideas within the field.
Conclusion
Richard C Barry's contributions to stereoscopic radiographic inspection technology exemplify the impact of innovative thinking in engineering. His patent and work at Lockheed Missiles & Space Company, Inc. highlight his commitment to advancing inspection methodologies.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
