Richard Blattert

Title: Richard Blattert: Innovator in Conductive Material Measurement

Introduction

Richard Blattert is a notable inventor based in Murr, Germany. He has made significant contributions to the field of measurement technology, particularly in determining the thickness of electrically conductive materials. With a total of 2 patents to his name, Blattert's work has advanced the accuracy and reliability of measurements in various applications.

Latest Patents

Blattert's latest patents include a method for determining the thickness of a layer of electrically conductive material. This innovative method addresses measurement errors that arise from the varying quality of the basic material. By ascertaining a dimensionless characteristic value (K) for each basic material, he utilizes a characteristic calibration curve to assign a correction factor (F). This allows for the conversion of the measured value of layer thickness (D) into a real value, effectively eliminating discrepancies caused by different electrical and magnetic properties.

Another significant patent is a process for determining the thickness of a layer of electroconductive material deposited on a body. In this process, measurement errors are converted into dimensionless norm values through a normalization process. This conversion helps to mitigate errors due to temperature drift and the varying properties of the base material. The norm values are then transformed into layer thickness values using a calibration curve, enhancing the precision of the measurements.

Career Highlights

Richard Blattert is currently employed at Robert Bosch GmbH, a leading company in engineering and technology. His work at Bosch has allowed him to apply his innovative ideas in a practical setting, contributing to the company's reputation for quality and precision in measurement technology.

Collaborations

Throughout his career, Blattert has collaborated with esteemed colleagues such as Klaus Dobler and Hansjoerg Hachtel. These partnerships have fostered an environment of innovation and have led to the development of advanced measurement techniques.

Conclusion

Richard Blattert's contributions to the field of conductive material measurement exemplify the impact of innovation in technology. His patents not only enhance measurement accuracy but also pave the way for future advancements in the industry.