The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 09, 2002
Filed:
Apr. 28, 2000
Klaus Dobler, Gerlingen, DE;
Hansjoerg Hachtel, Weissach, DE;
Reinhard Dimke, Stuttgart, DE;
Franz Auf Der Heide, Litzendorf, DE;
Richard Blattert, Murr, DE;
Josef Weber, Oberriexingen, DE;
Robert Bosch GmbH, Stuttgart, DE;
Abstract
In a method for determining a thickness of a layer of electromagnetically conductive material, the measurement errors resulting from different quality of the basic material are eliminated. For each basic material, one dimensionless characteristic value (K) is ascertained. With the aid of a characteristic calibration curve, each characteristic value (K) can be assigned a correction factor (F), with which the measured value of the layer thickness (D ) can be converted into a real value of the layer thickness (D). Different electrical and magnetic properties, dictated by the different quality of the basic material, can thus be largely eliminated.