Litzendorf, Germany

Franz Auf Der Heide


Average Co-Inventor Count = 6.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 2002

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1 patent (USPTO):Explore Patents

Title: Franz Auf Der Heide: Innovator in Electromagnetic Measurement

Introduction

Franz Auf Der Heide is a notable inventor based in Litzendorf, Germany. He has made significant contributions to the field of electromagnetic measurement, particularly through his innovative patent. His work focuses on improving the accuracy of measuring the thickness of layers of electrically conductive materials.

Latest Patents

Franz Auf Der Heide holds a patent for a method that determines the thickness of a layer of electromagnetically conductive material. This method effectively eliminates measurement errors that arise from variations in the quality of the basic material. For each type of basic material, a dimensionless characteristic value (K) is determined. Using a characteristic calibration curve, each characteristic value (K) is assigned a correction factor (F). This allows the measured value of the layer thickness (D) to be converted into a real value of the layer thickness (D). The method significantly reduces the impact of different electrical and magnetic properties caused by the varying quality of the basic material.

Career Highlights

Franz Auf Der Heide has dedicated his career to advancing measurement techniques in the field of electromagnetism. His innovative approach has garnered attention and respect within the industry. He is associated with Robert Bosch GmbH, a leading company known for its engineering and technology solutions.

Collaborations

Franz has collaborated with notable colleagues, including Klaus Dobler and Hansjoerg Hachtel. Their combined expertise has contributed to the development of advanced measurement techniques and technologies.

Conclusion

Franz Auf Der Heide's contributions to the field of electromagnetic measurement exemplify the importance of innovation in technology. His patented method for determining layer thickness showcases his commitment to enhancing measurement accuracy. His work continues to influence the industry and inspire future advancements.

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