This inventor holds 1 USPTO granted patent. Top assignee: Consiglio Nazionale Delle Ricerche. Active years: 1983.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 1983
Title: Riccardo Vanni: Innovator in Radiation Monitoring Technology
Introduction
Riccardo Vanni is a notable inventor based in Florence, Italy. He has made significant contributions to the field of radiation monitoring technology. His innovative approach has led to the development of a unique instrument designed to monitor radiation hazards arising from electromagnetic fields.
Latest Patents
Riccardo Vanni holds a patent for an "Instrument for monitoring the radiation hazard arising from electric." This instrument is designed to monitor the hazards associated with electromagnetic radio-frequency fields. It comprises an electric and/or magnetic field probe, a radio-frequency converter that transforms the signals from the probe into continuous current electric signals, and a comparator that compares these signals with predetermined reference values. The output indicators are activated by the comparator's output signals. The reference values categorize the field levels into three zones: insignificant risk, possible risk, and certain risk.
Career Highlights
Riccardo Vanni is affiliated with the Consiglio Nazionale delle Ricerche, where he continues to advance his research and development efforts. His work focuses on enhancing safety measures related to electromagnetic fields, which is crucial in today's technology-driven world.
Collaborations
Riccardo has collaborated with notable colleagues such as Nicola Rubino and Marco Bini. Their combined expertise contributes to the innovative projects undertaken at their research institution.
Conclusion
Riccardo Vanni's contributions to radiation monitoring technology exemplify the importance of innovation in ensuring safety in our increasingly electronic environment. His work not only addresses current challenges but also paves the way for future advancements in the field.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
