Guildford, United Kingdom

Ricardo Simon Sussmann

This inventor holds 1 USPTO granted patent. Top assignee: Gersan Establishment. Active years: 1999.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ricardo Simon Sussmann. Retrieved from https://idiyas.com/inventor/ricardo-simon-sussmann-50pml306

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 8(Granted Patents)


Company Filing History:


Years Active: 1999

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1 patent (USPTO):Explore Patents

Title: Ricardo Simon Sussmann: Innovator in Diamond Examination

Introduction

Ricardo Simon Sussmann is a notable inventor based in Guildford, GB. He has made significant contributions to the field of diamond examination, showcasing his expertise through his innovative patent.

Latest Patents

Sussmann holds a patent related to the examination of diamonds. This patent reflects his commitment to advancing techniques in gemology and enhancing the understanding of diamond properties. He has 1 patent to his name, which underscores his innovative approach in this specialized area.

Career Highlights

Throughout his career, Sussmann has been associated with Gersan Establishment, where he has applied his knowledge and skills in diamond examination. His work at this company has allowed him to explore various aspects of gemology and contribute to advancements in the field.

Collaborations

Sussmann has collaborated with notable colleagues, including Martin P Smith and James Gordon Smith. These partnerships have likely enriched his work and fostered a collaborative environment for innovation.

Conclusion

Ricardo Simon Sussmann is a dedicated inventor whose work in diamond examination has made a significant impact in the field. His patent and collaborations highlight his commitment to innovation and excellence in gemology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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